BS EN 62047-13:2012 | British Standards

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Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures

BS EN 62047-13:2012

Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures

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ISBN: 9780580694509

Keywords:
Semiconductor devices, Semiconductor technology, Electromechanical devices, Test equipment, Resonance, Integrated circuits, Bend testing, Test specimens, Fatigue testing, Electronic equipment and components, Thin-film devices, Vibration, PDF

Publication Date	31 May 2012
Product SKU	30211455
ISBN	9780580694509
BSI Code	BS EN 62047-13:2012
No. of pages	18
Publisher	British Standards Institution

Identical National Standard to:

IEC 61097-4:2012/AMD1:2016
EN 62047-13:2012
IEC 62047-13:2012

BS EN 62047-13:2012 | British Standards

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