BS EN 62047-12:2011 | British Standards

Standards Shop | ICS 31 | ICS 31.080 | ICS 31.080.99

Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

BS EN 62047-12:2011

Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Buy a printed copy from us with a 10% discount, or follow the link to purchase a PDF on the BSI website.

BSI Price (PDF/Printed): £244.00
Our Price (Printed only): £219.60

ISBN: 9780580763014

Keywords:
Semiconductor devices, Test equipment, Vibration, Bend testing, Fatigue testing, Integrated circuits, Electromechanical devices, Test specimens, Thin-film devices, Semiconductor technology, Resonance, Electronic equipment and components, PDF

Publication Date	30 Nov 2011
Product SKU	30245341
ISBN	9780580763014
BSI Code	BS EN 62047-12:2011
No. of pages	34
Publisher	British Standards Institution

Identical National Standard to:

IEC 62047-12:2011
EN 62047-12:2011

BS EN 62047-12:2011 | British Standards

Popular Topics