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BS EN 60749-7:2011 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases

BS EN 60749-7:2011

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases


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ISBN: 9780580687525

Keywords:
Water vapour, Mechanical testing, Climate, Moisture measurement, Integrated circuits, Semiconductor devices, Environmental testing, Water-vapour tests, Electronic equipment and components, Gas analysis, PDF
Publication Date30 Sep 2011
Product SKU30208080
ISBN9780580687525
BSI CodeBS EN 60749-7:2011
No. of pages16
ReplacesBS EN 60749-7:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-7:2011
  • EN 60749-7:2011




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