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BS EN 60749-40:2011 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge

BS EN 60749-40:2011

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge


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ISBN: 9780580646294

Keywords:
Integrated circuits, Drop tests, Mechanical testing, Semiconductor devices, Electronic equipment and components, Impact testing, Strain measurement, Surface mounting devices, Accelerated testing, Environmental testing, Printed-circuit boards, PDF
Publication Date30 Sep 2011
Product SKU30190357
ISBN9780580646294
BSI CodeBS EN 60749-40:2011
No. of pages26
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60384-3:2006
  • IEC 60749-40:2011
  • EN 60749-40:2011




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