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BS EN 60749-29:2011 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Latch-up test

Semiconductor devices. Mechanical and climatic test methods Latch-up test

BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods Latch-up test


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ISBN: 9780580691386

Keywords:
Climate, Electrical testing, Overvoltage, Destructive testing, Failure rate, Environmental testing, Overvoltage tests, Mechanical testing, Electronic equipment and components, Integrated circuits, Semiconductor devices, Electrical faults, Electrical impedance, PDF
Publication Date31 Aug 2011
Product SKU30209747
ISBN9780580691386
BSI CodeBS EN 60749-29:2011
No. of pages26
ReplacesBS EN 60749-29:2003|BS EN 60749-29:2003
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-29:2011
  • EN 60749-29:2011




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