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BS EN 60749-19:2003+A1:2010 | British Standards

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BS EN 60749-19:2003+A1:2010
BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods. Die shear strength
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ISBN:9780580687457

Keywords:
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Electrical equipment, Electrical components, Shear strength, Shear testing, Strength of materials, Substrates (insulating), Quality control, PDF
Publication Date20/06/03
Product SKU30208059
ISBN9780580687457
BSI CodeBS EN 60749-19:2003+A1:2010
No. of pages10
ReplacesBS EN 60749:1999
CategorySemiconductor devices in general
PublisherBritish Standards Institution
PDF DownloadYes
HardcopyYes
AKABSEN60749-19:2003+A1:2010, BS EN 60749 Part 19:2003+A1:2010
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