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BS EN 15991:2015 | British Standards

Standards Shop | ICS 81 | ICS 81.060 |  ICS 81.060.10

81.060.10 Raw materials

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

BS EN 15991:2015

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)


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ISBN: 9780580831409

Keywords:
Ceramics, Carbides, Determination of content, Vaporization, Trace element analysis, Chemical analysis and testing, Silicon inorganic compounds, Particulate materials, Raw materials, Refractory materials, Impurities, Emission spectrophotometry, PDF
Publication Date30 Nov 2015
Product SKU30283940
ISBN9780580831409
BSI CodeBS EN 15991:2015
No. of pages30
ReplacesBS EN 15991:2011
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 15991:2015




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